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      Conduction mechanism change with transport oxide layer thickness in oxide hetero-interface diode

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          Fowler‐Nordheim Tunneling into Thermally Grown SiO2

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            Simplified Theory of Space-Charge-Limited Currents in an Insulator with Traps

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              An R-squared measure of goodness of fit for some common nonlinear regression models

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                Author and article information

                Journal
                Applied Physics Letters
                Appl. Phys. Lett.
                AIP Publishing
                0003-6951
                1077-3118
                July 31 2017
                July 31 2017
                : 111
                : 5
                : 053506
                Affiliations
                [1 ]Program in Nano Science and Technology, Graduate School of Convergence Science and Technology, Seoul National University, Seoul 08826, South Korea
                [2 ]School of Electrical and Electronic Engineering, Yonsei University, Seoul 120-749, South Korea
                [3 ]Innovation Center for Chemical Engineering, Incheon National University, Incheon 406-840, South Korea
                [4 ]Department of Materials Science and Engineering, Incheon National University, 406-840 Incheon, South Korea
                [5 ]Advanced Institute of Convergence Technology, Gyeonggi-do 443-270, South Korea
                Article
                10.1063/1.4996862
                7a1e5456-143e-4cf0-8b7d-b0bc31ba027a
                © 2017
                History

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