Use of the Voigt function in a single-line method for the analysis of X-ray diffraction line broadening

de Keijser, Th. H.; Langford, J. I.; Mittemeijer, E. J.; Vogels, A. B. P.

doi:10.1107/S0021889882012035

Record: found
Abstract: not found
Article: not found

Use of the Voigt function in a single-line method for the analysis of X-ray diffraction line broadening

Author(s): Th. H. de Keijser , J. I. Langford , E. J. Mittemeijer , A. B. P. Vogels

Publication date Created: June 1982

Publication date (Print): June 1982

Journal: Journal of Applied Crystallography

Publisher: International Union of Crystallography (IUCr)

Read this article at

ScienceOpenPublisher

Bookmark

There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

Related collections

Author and article information

Journal

Journal ID (publisher-id): JACGAR

Title: Journal of Applied Crystallography

Abbreviated Title: J Appl Crystallogr

Publisher: International Union of Crystallography (IUCr)

ISSN (Print): 0021-8898

Publication date Created: June 1982

Publication date (Print): June 1982

Volume: 15

Issue: 3

Pages: 308-314

Article

DOI: 10.1107/S0021889882012035

SO-VID: 44c770ae-aef6-462d-90a3-85a5b90b86ea

History

Data availability:

Comments

Comment on this article

scite_

Cited by 96

See all cited by

Use of the Voigt function in a single-line method for the analysis of X-ray diffraction line broadening

Read this article at

Related collections

TKD - Transmission Kikuchi Diffraction

Author and article information

Journal

Article

History

Comments

Comment on this article

Similar content 3,163

Cited by 96