TKD - Transmission Kikuchi Diffraction by Angus J Wilkinson

This collection contains papers describing the development and application of the Transmission Kikuchi Diffraction (TKD) technique.

TKD is a scanning electron microscope (SEM) based technique allowing measurement and mapping of crystal phase, orientation and misorientation in crystalline samples at a spatial resolution significantly finer than for conventional EBSD.  The method necessitates the use of a thin electron transparent foil, which is mounted at near normal incidence and at relatively short working distance so that it is above the EBSD detector which then records the transmitted electron diffraction pattern.  The detector screen can be either by near vertical in the standard EBSD geometry (off-axis configuration), or placed directly below the sample with the screen horizontal (on-axis configuration).

The technique has been adopted relatively quickly by groups across the globe due to the wide availability EBSD systems and familiarity with the analysis procedures and data that can be generated.  This coupled with the improved spatial resolution has made the technique attractive with a low barrier to getting started, especially in labs with existing expertise in making thin foils for TEM work.  It has already found wide ranging applications in analysis of structural and functional material systems.

This collection is intended to be an inclusive list of contributions in the field of transmission Kikuchi diffraction and related imaging methods in the SEM.  Please get in touch if you feel there are additional papers which could usefully be added to this collection (even if you are an author).  I hope the collection is useful to some – if it is please let you colleagues know.

Angus J Wilkinson
January 2020