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Advances in X-ray Analysis
Common Sources of Error in Electron Probe Microanalysis
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Author(s):
Kurt F. J. Heinrich
Publication date
(Print):
1968
Publisher:
Springer US
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Electron Channelling Contrast Imaging (ECCI)
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36
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Atomic Fluorescence Yields
C. SWIFT
,
R. W. FINK
,
R. C. JOPSON
…
(1966)
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Continuous Series of Metastable Solid Solutions in Silver‐Copper Alloys
R. WILLENS
,
Pol Duwez
,
W Klement
(1960)
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Sur les bases physiques de l'analyse ponctuelle par spectrographie X
Raymond Castaing
,
Jacques Descamps
(1955)
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Author and book information
Book Chapter
Publication date (Print):
1968
Pages
: 40-55
DOI:
10.1007/978-1-4684-8676-6_3
SO-VID:
b123e204-05c6-474e-b209-13c998be2405
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Book chapters
pp. 1
Recent Advances in Quantitative X-Ray Spectrometric Analysis by Solution Techniques
pp. 23
X-Ray Fluorescence Spectroscopy in the Analysis of Ores, Minerals, and Waters
pp. 40
Common Sources of Error in Electron Probe Microanalysis
pp. 56
X-Ray Spectrographic Analysis of Traces in Metals by Preconcentration Techniques
pp. 249
Applications of a Portable Radioisotope X-Ray Fluorescence Spectrometer to Analysis of Minerals and Alloys
pp. 287
Quantitative Microprobe Analysis of Thin Insulating Films
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