Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy : A Laboratory Workbook

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Author(s): Charles E. Lyman , Joseph I. Goldstein , Alton D. Romig , Patrick Echlin , David C. Joy , Dale E. Newbury , David B. Williams , John T. Armstrong , Charles E. Fiori , Eric Lifshin , Klaus-Ruediger Peters

Publication date (Print): 1990

Publisher: Springer US

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ISBN (Print): 978-0-306-43591-1

ISBN (Electronic): 978-1-4613-0635-1

Publication date (Print): 1990

DOI: 10.1007/978-1-4613-0635-1

SO-VID: 3e560a31-989d-44d6-bb57-ec87eb0e2567

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