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      Soft errors induced by alpha particles

      IEEE Transactions on Reliability
      Institute of Electrical and Electronics Engineers (IEEE)

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          Penetration of Protons, Alpha Particles, and Mesons

          U Fano (1963)
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            • Record: found
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            Material failure mechanisms and damage models

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              • Record: found
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              The Effects of Radiation on Electronic Systems

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                Author and article information

                Journal
                IEEE Transactions on Reliability
                IEEE Trans. Rel.
                Institute of Electrical and Electronics Engineers (IEEE)
                00189529
                June 1996
                : 45
                : 2
                : 174-179
                Article
                10.1109/24.510798
                d4179c06-7304-42be-a155-c858c80c2779
                © 1996
                History

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