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Large‐scale quantification of aluminum in Al
x
Ga
1‐
x
N alloys by ToF‐SIMS: The benefit of secondary cluster ions
Author(s):
Rong Huang
,
Xiao Chen
,
Fangsen Li
,
Sunan Ding
,
Hui Yang
Publication date:
2020
Journal:
Surface and Interface Analysis
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High Entropy Alloys and Complex Concentrated Alloys
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DOI::
10.1002/sia.6760
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