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Nanoscale CuO solid-electrolyte-based conductive-bridging, random-access memory cell with a TiN liner
Author(s):
Jong-Sun Lee
,
Dong-Won Kim
,
Hea‐Jee Kim
,
Soo‐Min Jin
,
Myung-Jin Song
,
Ki-Hyun Kwon
,
Jea-Gun Park
,
Mohammed Jalalah
,
Ali Al-Hajry
Publication date:
2018
Journal:
Journal of the Korean Physical Society
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Embodied Memory
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DOI::
10.3938/jkps.72.116
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