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      Organic Spin-Valves and Beyond: Spin Injection and Transport in Organic Semiconductors and the Effect of Interfacial Engineering

      1 , 2 , 1
      Advanced Materials
      Wiley

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          Interfacial charge-spin coupling: Injection and detection of spin magnetization in metals.

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            Electrical spin injection and accumulation at room temperature in an all-metal mesoscopic spin valve.

            Finding a means to generate, control and use spin-polarized currents represents an important challenge for spin-based electronics, or 'spintronics'. Spin currents and the associated phenomenon of spin accumulation can be realized by driving a current from a ferromagnetic electrode into a non-magnetic metal or semiconductor. This was first demonstrated over 15 years ago in a spin injection experiment on a single crystal aluminium bar at temperatures below 77 K. Recent experiments have demonstrated successful optical detection of spin injection in semiconductors, using either optical injection by circularly polarized light or electrical injection from a magnetic semiconductor. However, it has not been possible to achieve fully electrical spin injection and detection at room temperature. Here we report room-temperature electrical injection and detection of spin currents and observe spin accumulation in an all-metal lateral mesoscopic spin valve, where ferromagnetic electrodes are used to drive a spin-polarized current into crossed copper strips. We anticipate that larger signals should be obtainable by optimizing the choice of materials and device geometry.
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              Das, Spintronics: Fundamentals and applications

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                Author and article information

                Journal
                Advanced Materials
                Adv. Mater.
                Wiley
                09359648
                January 2017
                January 2017
                November 15 2016
                : 29
                : 2
                : 1602739
                Affiliations
                [1 ]Engineering Physics Division; National Institute of Standards and Technology; 100 Bureau Drive Gaithersburg MD 20899 USA
                [2 ]Theiss Research; La Jolla CA 92037 USA
                Article
                10.1002/adma.201602739
                8b33d481-a209-44a1-81e7-57ca5bc3e230
                © 2016

                http://doi.wiley.com/10.1002/tdm_license_1

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