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      Simultaneous switching noise in on-chip CMOS power distribution networks

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          Modeling and simulation of insulated-gate field-effect transistor switching circuits

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            A 200-MHz 64-b dual-issue CMOS microprocessor

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              CMOS Circuit Speed and Buffer Optimization

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                Author and article information

                Journal
                IEEE Transactions on Very Large Scale Integration (VLSI) Systems
                IEEE Trans. VLSI Syst.
                Institute of Electrical and Electronics Engineers (IEEE)
                1063-8210
                1557-9999
                August 2002
                August 2002
                : 10
                : 4
                : 487-493
                Article
                10.1109/TVLSI.2002.800533
                8618624c-aa84-469e-ae49-783195d65ff4
                © 2002
                History

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