An AR-Assisted Deep Learning-Based Approach for Automatic Inspection of Aviation Connectors

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Contributors

Shufei Li: (View ORCID Profile)

Pai Zheng: (View ORCID Profile)

Lianyu Zheng: (View ORCID Profile)

Journal

Title: IEEE Transactions on Industrial Informatics

Abbreviated Title: IEEE Trans. Ind. Inf.

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

ISSN (Print): 1551-3203

ISSN (Electronic): 1941-0050

Publication date Created: March 2021

Publication date (Print): March 2021

Volume: 17

Issue: 3

Pages: 1721-1731

Article

DOI: 10.1109/TII.2020.3000870

SO-VID: 437cbca0-5210-4711-a7b8-eedcff902aab

License:

https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html

https://doi.org/10.15223/policy-029

https://doi.org/10.15223/policy-037

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