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      High-Accuracy Synchronous Extraction Algorithm of Star and Celestial Body Features for Optical Navigation Sensor

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          Most cited references24

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          Bidirectional reflectance spectroscopy: 1. Theory

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            Accuracy of the gaussian point spread function model in 2D localization microscopy.

            The gaussian function is simple and easy to implement as Point Spread Function (PSF) model for fitting the position of fluorescent emitters in localization microscopy. Despite its attractiveness the appropriateness of the gaussian is questionable as it is not based on the laws of optics. Here we study the effect of emission dipole orientation in conjunction with optical aberrations on the localization accuracy of position estimators based on a gaussian model PSF. Simulated image spots, calculated with all effects of high numerical aperture, interfaces between media, polarization, dipole orientation and aberrations taken into account, were fitted with a gaussian PSF based Maximum Likelihood Estimator. For freely rotating dipole emitters it is found that the gaussian works fine. The same, theoretically optimum, localization accuracy is found as if the true PSF were a gaussian, even for aberrations within the usual tolerance limit of high-end optical imaging systems such as microscopes (Marechal's diffraction limit). For emitters with a fixed dipole orientation this is not the case. Localization errors are found that reach up to 40 nm for typical system parameters and aberration levels at the diffraction limit. These are systematic errors that are independent of the total photon count in the image. The gaussian function is therefore inappropriate, and more sophisticated PSF models are a practical necessity.
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              Accuracy performance of star trackers - a tutorial

              C.C. Liebe (2002)
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                Author and article information

                Journal
                IEEE Sensors Journal
                IEEE Sensors J.
                Institute of Electrical and Electronics Engineers (IEEE)
                1530-437X
                1558-1748
                2379-9153
                January 15 2018
                January 15 2018
                : 18
                : 2
                : 713-723
                Article
                10.1109/JSEN.2017.2777493
                0aa18c3b-4a6e-4be5-9497-ba75dbdebd42
                © 2018
                History

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