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      Oberflächen- und Dünnschicht-Technologie : Teil I: Beschichtungen von Oberflächen 

      Meß- und Prüftechnik von Oberflächen und dünnen Schichten

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      Publisher: Springer Berlin Heidelberg

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          Investigation of film‐thickness determination by oscillating quartz resonators with large mass load

          Chih‐Shun Lu, Owen T Lewis (1972)
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            Verwendung von Schwingquarzen zur Wägung dünner Schichten und zur Mikrowägung

            G. Sauerbrey, G. Sauerbrey, G�nter Sauerbrey … (1959)
            Article 0 comments Cited 38 times – based on 0 reviews     Review now
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              Measurement of Adhesion of Thin Films

              P. Benjamin, C. Weaver (1960)
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                Publication date (Print): 1987
                Pages: 34-55
                DOI: 10.1007/978-3-642-82835-5_3
                SO-VID: c9aef20a-392e-49da-9202-cbbb10566cc2
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