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      Mustererkennung 1996 : 18. DAGM-Symposium Heidelberg, 11.–13. September 1996 

      Schnelle Segmentierung von Tiefenbildern

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      Springer Berlin Heidelberg

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          Fast segmentation of range images into planar regions by scan line grouping

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            Segmentation of range images as the search for geometric parametric models

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              Surfaces in Range Image Understanding

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                Book Chapter
                1996
                : 400-407
                10.1007/978-3-642-80294-2_42
                4e704b51-1c6f-4540-b058-5db32646ec48
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