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      Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse

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      Springer Berlin Heidelberg

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          978-3-662-12110-8
          978-3-662-12108-5
          1969
          10.1007/978-3-662-12108-5
          0563a802-454e-4b8f-9531-ce0de908dda3
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