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      Micromachined Ultrasonic Transducers and Acoustic Sensors Based on Piezoelectric Thin Films

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      Springer US

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          {1 0 0}-Textured, piezoelectric Pb(Zrx, Ti1−x)O3 thin films for MEMS: integration, deposition and properties

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            Measurement of the effective transverse piezoelectric coefficient e31,f of AlN and Pb(Zrx,Ti1−x)O3 thin films

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              The wafer flexure technique for the determination of the transverse piezoelectric coefficient (d31) of PZT thin films

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                Author and book information

                Book Chapter
                2005
                : 37-48
                10.1007/0-387-23319-9_3
                91e49dfb-8d58-44fa-afd9-b933b72f82a8
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