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Effects of Boundary Lubricants and Metallic Oxides in Steel-Steel Tribological Junctions Studied with the Atomic Force Microscope
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Author(s):
M. P. Everson
,
A. K. Gangopadhyay
,
R. C. Jaklevic
,
D. Scholl
,
Weidian Shen
Publication date
(Print):
1995
Publisher:
Springer Netherlands
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Atomic Force Microscopy
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Principles of Tribology
J. Halling
(1978)
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Book Chapter
Publication date (Print):
1995
Pages
: 425-430
DOI:
10.1007/978-94-011-0049-6_37
SO-VID:
d9c4de60-d897-4f17-8683-6b8633121fd9
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Book chapters
pp. 1
The Nanometer Age: Challenge and Chance
pp. 15
Scanning Probe Microscopy Instrumentation
pp. 35
Low Temperature Scanning Force Microscopy
pp. 63
Measuring Ultrafast Voltage Signals Using a Scanning Force Microscope
pp. 69
Oscillating String as a Force Sensor in Scanning Force Microscopy
pp. 79
Electrostatically Actuated Silicon Micromachined Sensors for Scanning Force Microscopy
pp. 85
Effect of Overlayer Thickness on the Nanoindentation of SiO2 /Si
pp. 91
Nanostethoscopy: A New Mode of Operation of the Atomic Force Microscope
pp. 99
A Multi-Test Instrument Based on Scanning Probe Technologies
pp. 105
Hydrophobic Surface Interactions Studied Using a Novel Force Microscope
pp. 113
Imaging Local Electric Forces in Organic Thin Films by Scanning Maxwell Stress Microscopy
pp. 119
Simultaneous AFM and Local Conductivity Imaging
pp. 123
Micromechanical Heat Sensor: Observation of a Chemical Reaction, Photon and Electrical Heat Pulses
pp. 133
Forces in Scanning Probe Microscopy
pp. 149
Controlled Motion of Xe Atom on Metal Surfaces
pp. 157
Van Der Waals Forces and Probe Geometries for Some Specific Scanning Force Microscopy Studies
pp. 169
Atomistic Theory of the Interaction Between AFM Tips and Ionic Surfaces
pp. 175
Molecular Dynamics Simulation of Atomic-Scale Adhesion, Deformation, Friction, and Modification of Diamond Surfaces
pp. 183
Simulation of SFM Images of Adsorbed C 60 and C 70 Molecules
pp. 191
Atomic-Scale Metal Adhesion
pp. 235
Photons and Forces I: Light Generates Force
pp. 249
Photons and Forces 11: Forces Influence Light
pp. 263
Interfacial Friction and Adhesion of Wetted Monolayers
pp. 273
Coherent Phonon Generation in the Process of Friction
pp. 285
Friction Force Microscopy
pp. 307
Molecular Scale Study of Domain Boundaries and Frictional Stick-Slip Motion on Lipid Bilayers
pp. 313
Two-Dimensional Atomic-Scale Friction Observed with an AFM
pp. 319
Normal and Lateral Forces in Friction Force Microscopy
pp. 325
Nanotribology and Chemical Sensitivity on a Nanometer Scale
pp. 331
Lateral Force Measurements on Phase Separated Polymer Surfaces
pp. 337
Friction and Load on Well Defined Surfaces Studied by Atomic Force Microscopy
pp. 345
Friction on an Atomic Scale
pp. 353
Nanomechanics: — Atomic Resolution and Frictional Energy Dissipation in Atomic Force Microscopy
pp. 367
Nanotribology and its Applications to Magnetic Storage Devices and MEMS
pp. 397
Lifeime Criteria of Macro- and Microtribological Systems
pp. 405
Mechanical Property Evaluations of Solid Surfaces as a Technological Application of SPM
pp. 425
Effects of Boundary Lubricants and Metallic Oxides in Steel-Steel Tribological Junctions Studied with the Atomic Force Microscope
pp. 431
High-Density Recording Technologies as an Application of SPM
pp. 447
Applications of Magnetic Force Microscopy
pp. 471
Magnetic Force Microscopy on Thin Film Magnetic Recording Media
pp. 477
Analysis of Vortices in Superconductors by Scanning Probe Microscopy
pp. 483
Understanding Surface Chemical Processes in Environmental Contamination: New Applications for AFM
pp. 489
Force Microscopy of Heavy Ion Irradiated Materials
pp. 495
Atomic Force Microscopy as a Tool to Study Surface Roughness Effects in X-Ray Photoelectron Spectroscopy
pp. 501
Time Dependence and its Spatial Distribution of Densely Contact-Electrified Electrons on a Thin Silicon Oxide
pp. 507
Atomic-Resolution Image of GaAs(110) Surface with an Ultrahigh-Vacuum Atomic Force Microscope (UHV-AFM)
pp. 513
Giant Atomic Corrugations on Layered Dichalcogenides Investigated by AFM/LFM
pp. 519
Nanometer Scale Machining of Covalent Monolayers Investigated by Combined AFM/LFM
pp. 525
Atomic Resolution Imaging of ReS2 by AFM/LFM
pp. 531
Ultra-High-Vacuum Atomic Force Microscopy in the Study of Model Catalysts
pp. 537
AFM Observations of Si(111) in Solutions
pp. 543
Atomic Scale Force Mapping with the Atomic Force Microscope
pp. 551
Imaging Chemical Bonds by SPM
pp. 567
Study of Thin Organic Films by Various Scanning Force Microscopes
pp. 593
Molecular Arrangement and Mechanical Stability of Self-Assembled Monolayers on Au(111) Under Applied Load
pp. 599
Organic Interface Inspection by Scanning Force Microscopy
pp. 607
Atomic Force Microscopy of Biological Membranes: Current Possibilities and Prospects
pp. 615
Biomolecule Photoimmobilization: Application in Scanning Probe Microscopy
pp. 625
Measuring Molecular Adhesion with Force Microscopy
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